124 documents
- Pierre Slangen, Olivier Eterradossi, D. Lafon, P. Maury, Eve Péré. Introduction of new optical techniques to characterize the psycho-sensory properties of materials. La Revue de l'électricité et de l'électronique, 2004, 9, pp.56-62. ⟨hal-01581877⟩
- Sylvain Popineau, Benoît Gautier, Pierre Slangen, Martin E.R. Shanahan. A 3D effect in the wedge adhesion test : application of speckle interferometry. The Journal of Adhesion, 2004, 80, pp.1173 - 1194. ⟨10.1080/00218460490884349⟩. ⟨hal-00142198⟩
- Pierre Slangen, B. Gautier. Phase-shifting digital speckle pattern interferometry: off-the-shelf setup description and application to stainless steel membrane displacement measurements. Speckle Metrology 2003, Jun 2003, Trondheim, Norway. pp.76, ⟨10.1117/12.516580⟩. ⟨hal-02012250⟩
- Philippe Laflaquiere, Dominique Lafon, Olivier Eterradossi, Pierre Slangen. Characterization of color texture: CIEL*a*b* calibration of CCD device. Proc. SPIE 3409, SYBEN-Broadband European Networks and Electronic Image Capture and Publishing, Sep 1998, Zurich, France. pp.118-128, ⟨10.1117/12.324103⟩. ⟨hal-02012217⟩
- Ch. de Veuster, Pierre Slangen, Y. Renotte, L. Berwart, Y. Lion. Influence of the geometry of illumination and viewing beams on displacement measurement errors in interferometric metrology. Optics Communications, 1997, 143 (1-3), pp.95-101. ⟨10.1016/S0030-4018(97)00336-2⟩. ⟨hal-02012248⟩
- Christophe de Veuster, Pierre Slangen, Yvon Renotte, Leon Berwart, Yves Lion. In-line phase-shifter calibration and drift measurement and compensation for digital speckle pattern interferometry (DSPI). Advanced Imaging and Network Technologies, Dec 1996, berlin, France. pp.117-124, ⟨10.1117/12.262424⟩. ⟨hal-02299372⟩
- Pierre Slangen, Léon Berwart, Christophe de Veuster, Jean-Claude Golinval, Yves Lion. Digital speckle pattern interferometry (DSPI): A fast procedure to detect and measure vibration mode shapes. Optics and Lasers in Engineering, 1996, 25 (4-5), pp.311-321. ⟨hal-02012237⟩
- Pierre Slangen, Patrick Ienny, Max Nemoz-Gaillard. Speckle pattern correlation for local approach of damage evaluation. Lasers, Optics, and Vision for Productivity in Manufacturing I, Sep 1996, Besancon, France. pp.424-435, ⟨10.1117/12.250771⟩. ⟨hal-02299425⟩
- C. de Veuster, Pierre Slangen, Y. Renotte, L. Berwart, Y. Lion. Disk-growing algorithm for phase-map unwrapping: application to speckle interferograms. Applied optics, 1996, 35 (2), pp.240. ⟨hal-02012245⟩
- Pierre Slangen, Christophe Deveuster, Yvon Renotte, Léon Berwart, Yves Lion. Computer-aided interferometric measurements of drift and phase shifter calibration for digital speckle pattern interferometry. Optical Engineering, 1995, 34 (12), pp.3526. ⟨10.1117/12.215666⟩. ⟨hal-02012235⟩
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